Live Webinar: Enhanced Detection of Rubbers and Plastics
Introducing PXT: 3rd-Generation Photon-Counting X-ray
Program Overview
- X-ray Detection Technologies
- 3rd Generation Photon-Counting X-ray Technology
- Detection of Low-Density Contamination in Food
- Practical Real-World Examples
Detection expectations are increasing, particularly around low-density materials that have traditionally challenged X-ray systems. This session introduces PXT, the latest generation of photon-counting detector technology from Mettler Toledo, designed specifically to elevate foreign-material detection of low density in-organic foreign materials like rubbers, and plastics in food.
Speakers
JP Perreault
Head of METTLER TOLEDO X-ray Reclaim
JP Perreault is the Head of METTLER TOLEDO X-ray Reclaim, a North American leader in mobile inspection and product recovery services. With over 20 years of experience in the food processing and packaging automation industry, JP has established himself as a trusted voice on foreign material detection and brand protection. He founded and led Xray Reclaim which quickly became recognized for its rapid-response recovery services supporting food & beverage manufacturers during foreign material incidents. Xray Reclaim is now part of METTLER TOLEDO.
